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Exploration of VLSI CAD researches for early design rule evaluation | IEEE Conference Publication | IEEE Xplore

Exploration of VLSI CAD researches for early design rule evaluation


Abstract:

Design rule has been a primary metric to link design and technology, and is likely to be considered as IC manufacturer's role for the generation due to the empirical and ...Show More

Abstract:

Design rule has been a primary metric to link design and technology, and is likely to be considered as IC manufacturer's role for the generation due to the empirical and unsystematic in nature. Disruptive and radical changes in terms of layout style, lithography and device in the next decade require the design rule evaluation in early development stage. In this paper, we explore VLSI CAD researches for early and systematic evaluation of design rule, which will be a key technique for enhancing the competitiveness in IC market.
Date of Conference: 25-28 January 2011
Date Added to IEEE Xplore: 03 March 2011
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Conference Location: Yokohama, Japan

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