Yield-driven redundant power bump assignment for power network robustness | IEEE Conference Publication | IEEE Xplore

Yield-driven redundant power bump assignment for power network robustness


Abstract:

During package manufacturing process, open defects of power bumps may cause insufficient power supply and degrade the power network yield. This work presents a redundant ...Show More

Abstract:

During package manufacturing process, open defects of power bumps may cause insufficient power supply and degrade the power network yield. This work presents a redundant power bump insertion method to ensure power integrity by considering the power bump yields. The proposed method can efficiently assign redundant bumps by accurately estimating the location of worst load yield and minimizing the amounts of redundant bumps to enhance the power network yield.
Date of Conference: 16-19 January 2017
Date Added to IEEE Xplore: 20 February 2017
ISBN Information:
Electronic ISSN: 2153-697X
Conference Location: Chiba, Japan

References

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