Abstract:
A test monitor circuit for low-frequency noise characterization is demonstrated in 28nm CMOS technology. The circuit allows a fast evaluation of the low frequency noise p...Show MoreMetadata
Abstract:
A test monitor circuit for low-frequency noise characterization is demonstrated in 28nm CMOS technology. The circuit allows a fast evaluation of the low frequency noise performance of transistors, providing a digital output. The VCO-based quantizer used for analog to digital conversion is capable of converting signal of small amplitude, in the μV range. A good agreement between the results obtained with the proposed circuit and standard measurements techniques is obtained.
Published in: 2015 IEEE Asian Solid-State Circuits Conference (A-SSCC)
Date of Conference: 09-11 November 2015
Date Added to IEEE Xplore: 21 January 2016
Electronic ISBN:978-1-4673-7191-9