Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications | IEEE Conference Publication | IEEE Xplore
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Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications

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Aibin Yan; Xuehua Li; Zhongyu Gao; Zhengfeng Huang; Tianming Ni; Xiaoqing Wen
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Abstract:

With the rapid advancement of CMOS technologies, integrated circuits are becoming more prone to soft errors, e.g., triple-node upsets (TNUs). In this paper, to effectivel...Show More

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Abstract:

With the rapid advancement of CMOS technologies, integrated circuits are becoming more prone to soft errors, e.g., triple-node upsets (TNUs). In this paper, to effectively tolerate TNUs, an input-split C-element-based DICEs (IC-DICEs) based TNU-recovery latch is proposed. The latch employs three interlocked IC-DICEs to allow recovering from any TNU. Simulations demonstrate the TNU recovery of the latch, and also demonstrate that the proposed latch can reduce delay by 87.21%, area by 27.04%, and delay-area-power product (DAPP) by 87.44% on average, compared to the alternative latches.
Published in: 2023 IEEE 32nd Asian Test Symposium (ATS)
Date of Conference: 14-17 October 2023
Date Added to IEEE Xplore: 20 November 2023
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DOI: 10.1109/ATS59501.2023.10317977
Conference Location: Beijing, China

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