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Using Artificial Neural Network to Predict Value-at-Risk of S&P 500 Market Index with External Information | IEEE Conference Publication | IEEE Xplore

Using Artificial Neural Network to Predict Value-at-Risk of S&P 500 Market Index with External Information


Abstract:

Previous studies on forecasting Value-at-Risk mostly focus on using the information directly obtained from the market itself. In this paper, we propose a new method for p...Show More

Abstract:

Previous studies on forecasting Value-at-Risk mostly focus on using the information directly obtained from the market itself. In this paper, we propose a new method for predicting Value-at-Risk by incorporating both internal and external information using artificial neural network. We show that artificial neural network can provide us a flexible framework for including external information, and these additional factors can help to improve the accuracy of Value-at-Risk prediction.
Date of Conference: 29-31 May 2019
Date Added to IEEE Xplore: 31 October 2019
ISBN Information:
Conference Location: Honolulu, HI, USA

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