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Behavioral and transistor modeling of multi-phase injection ring oscillator | IEEE Conference Publication | IEEE Xplore

Behavioral and transistor modeling of multi-phase injection ring oscillator


Abstract:

This paper presents a system and transistor level analysis of multi-phase injection locking in ring oscillators. Injection strength defines noise reduction and locking ra...Show More

Abstract:

This paper presents a system and transistor level analysis of multi-phase injection locking in ring oscillators. Injection strength defines noise reduction and locking range. Behavioral and transistor models of locking compare the effectiveness of multi-phase and single-phase injection. Noise analysis shows that injection lowers the noise floor.
Date of Conference: 04-07 May 2014
Date Added to IEEE Xplore: 18 September 2014
ISBN Information:
Print ISSN: 0840-7789
Conference Location: Toronto, ON, Canada

References

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