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Monitoring Wheat Midge Populations using CNNs on White Sticky Cards of Pheromone Traps in Field Settings | IEEE Conference Publication | IEEE Xplore
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Monitoring Wheat Midge Populations using CNNs on White Sticky Cards of Pheromone Traps in Field Settings


Abstract:

One of the most common insects that attack wheat crops in North America is the orange wheat blossom midge (WMs) Sitodiplosis mosellana (Diptera: Cecidomyiidae). WMs larva...Show More

Abstract:

One of the most common insects that attack wheat crops in North America is the orange wheat blossom midge (WMs) Sitodiplosis mosellana (Diptera: Cecidomyiidae). WMs larvae cause significant feeding damage to wheat kernels, decreasing yield/productivity. To determine when WM adults emerge and to help determine population size and threat level, manual counts of male WM attracted to pheromone-baited sticky traps can be used. This method is labour-intensive due to the often large numbers of WM males stuck to traps (1500-3000), which can take around one hour to count properly. If multiple traps per field are used, the time to count is magnified. A machine vision system that monitors the traps with high frequency (48 times a day) is more convenient because it can continuously collect and analyze large amounts of data quickly and accurately. This research utilizes a state-of-the-art object detection network, You Only Look Once version 8 (YOLOv8), to detect and count WMs in the images taken from white sticky cards under natural field settings. It achieves a mean average precision (mAP at 0.5 IoU) of 87.11% and mAP at 0.5-0.95 IoU of 43.55% in detecting WMs with 98.7% precision and 99.03% recall values. These results represent an improvement over the performance of the previously top-performing object detection model, YOLOv5, which achieved mAP at IoU 0.5 of 77.37%, mAP at IoU 0.5-0.95 of 41.07%, a precision of 86.07%, and a recall value of 88.46%.
Date of Conference: 24-27 September 2023
Date Added to IEEE Xplore: 26 October 2023
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Conference Location: Regina, SK, Canada

References

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