An Improved DE Algorithm to Optimise the Learning Process of a BERT-based Plagiarism Detection Model | IEEE Conference Publication | IEEE Xplore

An Improved DE Algorithm to Optimise the Learning Process of a BERT-based Plagiarism Detection Model


Abstract:

Plagiarism detection is a challenging task, aiming to identify similar items in two documents. In this paper, we present a novel approach to automatic plagiarism detectio...Show More

Abstract:

Plagiarism detection is a challenging task, aiming to identify similar items in two documents. In this paper, we present a novel approach to automatic plagiarism detection that combines BERT (bidirectional encoder representations from transformers) word embedding, attention mechanism-based long short-term memory (LSTM) networks, and an improved differential evolution (DE) algorithm for weight initialisation. BERT is used to pretrain deep bidirectional representations in all layers, while the pre-trained BERT model can be fine-tuned with only one extra output layer without significant changes in architecture. Deep learning algorithms often use the random weighting method for initialisation, followed by gradient-based optimisation algorithms such as back-propagation for training, making them susceptible to getting trapped in local optima. To address this, population- based metaheuristic algorithms such as DE can be used. We propose an improved DE algorithm with a clustering-based mutation operator, where first a winning cluster of candidate solutions is identified and a new updating strategy is then applied to include new candidate solutions in the current population. The proposed DE algorithm is used in LSTM, attention mechanism, and feed- forward neural networks to yield the initial seeds for subsequent gradient-based optimisation. We compare our proposed model with conventional and population-based approaches on three datasets (SNLI, MSRP and SemEval2014) and demonstrate it to give superior plagiarism detection performance.
Date of Conference: 18-23 July 2022
Date Added to IEEE Xplore: 06 September 2022
ISBN Information:
Conference Location: Padua, Italy

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