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The crazy mixed up world of silicon debug [IC validation] | IEEE Conference Publication | IEEE Xplore

The crazy mixed up world of silicon debug [IC validation]


Abstract:

In this paper, we give an overview of the silicon debug process. We discuss the procedure of debug, along with the current state of the art tools and design features used...Show More

Abstract:

In this paper, we give an overview of the silicon debug process. We discuss the procedure of debug, along with the current state of the art tools and design features used to assist in the process of doing debug. In conclusion, we discuss what new challenges lay ahead in the area of silicon debug.
Date of Conference: 06-06 October 2004
Date Added to IEEE Xplore: 22 November 2004
Print ISBN:0-7803-8495-4
Conference Location: Orlando, FL, USA

References

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