Abstract:
In this paper, we propose a yield and speed enhancement scheme using a reconfigurable device. An LUT array LSI is fabricated on a 90nm process to measure process variatio...Show MoreMetadata
Abstract:
In this paper, we propose a yield and speed enhancement scheme using a reconfigurable device. An LUT array LSI is fabricated on a 90nm process to measure process variations of LUTs. D2D and WID variations are clearly observed. Reconfiguration using the measurement process variations boosts yield and also increases the average operating speed by 4.1%. In addition, it is proved that expansion of WID variations make the proposed method more effective
Date of Conference: 21-21 September 2005
Date Added to IEEE Xplore: 10 January 2006
Print ISBN:0-7803-9023-7
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