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Session 16 - Embedded memory | IEEE Conference Publication | IEEE Xplore

Abstract:

Penetrating into sub-tenth micron regime, variations in transistor characteristics are having a more critical impact on the design of high-density memories, such as SRAM,...Show More

Abstract:

Penetrating into sub-tenth micron regime, variations in transistor characteristics are having a more critical impact on the design of high-density memories, such as SRAM, Flash and ROM. In this session, two papers from industry and five papers from academia will be presented.
Date of Conference: 21-24 September 2008
Date Added to IEEE Xplore: 17 November 2008
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Conference Location: San Jose, CA, USA