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Advanced memory topics

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Koji Niii; Toshiaki Kirihata
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Abstract:

This session covers scaling challenges, latest advances, and future trends on spin-torque MRAM, NAND, and logic-compatible flash, TCAM, and 6T/8T SRAM in advanced technol...Show More

Metadata

Abstract:

This session covers scaling challenges, latest advances, and future trends on spin-torque MRAM, NAND, and logic-compatible flash, TCAM, and 6T/8T SRAM in advanced technology nodes.
Published in: Proceedings of the IEEE 2013 Custom Integrated Circuits Conference
Date of Conference: 22-25 September 2013
Date Added to IEEE Xplore: 11 November 2013
Electronic ISBN:978-1-4673-6146-0

ISSN Information:

DOI: 10.1109/CICC.2013.6658564
Conference Location: San Jose, CA, USA
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