Abstract:
As integrated circuits become larger scale and more complex, more sophisticated simulation techniques are being developed for scalable analysis of variability, nonlineari...Show MoreMetadata
Abstract:
As integrated circuits become larger scale and more complex, more sophisticated simulation techniques are being developed for scalable analysis of variability, nonlinearity and sensitivity. This session presents three papers describing new simulation techniques with applications to a wide variety of circuits, including amplifiers, oscillators, PLLs and MEMS devices.
Date of Conference: 15-17 September 2014
Date Added to IEEE Xplore: 06 November 2014
Electronic ISBN:978-1-4799-3286-3