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Scaling challenges of FinFET technology at advanced nodes and its impact on SoC design (Invited) | IEEE Conference Publication | IEEE Xplore

Scaling challenges of FinFET technology at advanced nodes and its impact on SoC design (Invited)


Abstract:

With the introduction of FinFET technology in mass production, more designs and complex designs are being ported on 22nm and 14nm/16nm FinFET transistors. However, all Fi...Show More

Abstract:

With the introduction of FinFET technology in mass production, more designs and complex designs are being ported on 22nm and 14nm/16nm FinFET transistors. However, all FinFET transistors are not made equal to offer best System-on-Chip (SoC) performance and power benefits. Careful selection of fin structural parameters is critical for best SoC performance. This paper discusses FinFET scaling challenges, their impact on SoC performance, key trade-offs and possible solutions for best SoC performance at current and future technology nodes.
Date of Conference: 28-30 September 2015
Date Added to IEEE Xplore: 30 November 2015
ISBN Information:
Conference Location: San Jose, CA, USA

References

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