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A 200MHz-BW 0.13mm2 62dB-DR VCO-based non-uniform sampling ADC with phase-domain level crossing in 65nm CMOS | IEEE Conference Publication | IEEE Xplore

A 200MHz-BW 0.13mm2 62dB-DR VCO-based non-uniform sampling ADC with phase-domain level crossing in 65nm CMOS


Abstract:

This paper introduces a VCO-based non-uniform sampling ADC that leverages phase-domain level crossing and VCO linearity calibration without continuous-time comparators an...Show More

Abstract:

This paper introduces a VCO-based non-uniform sampling ADC that leverages phase-domain level crossing and VCO linearity calibration without continuous-time comparators and a reference voltage generator. The SQNR is improved by first-order noise shaping and inherent dithering via non-uniform oversampling, as extra samples are naturally created by the free-running oscillation of VCO. This ADC achieves 200MHz BW with 62dB DR and consumes 19.7mW with an active area of 0.13 mm2 in 65nm CMOS.
Date of Conference: 08-11 April 2018
Date Added to IEEE Xplore: 10 May 2018
ISBN Information:
Electronic ISSN: 2152-3630
Conference Location: San Diego, CA, USA

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