Abstract:
In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integ...Show MoreMetadata
Abstract:
In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.
Published in: 2019 IEEE Custom Integrated Circuits Conference (CICC)
Date of Conference: 14-17 April 2019
Date Added to IEEE Xplore: 01 August 2019
ISBN Information: