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Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education | IEEE Conference Publication | IEEE Xplore

Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education


Abstract:

This paper presents a set of low-cost desktop IC test systems developed for engineering education. The set is implemented using the National Instrument (NI) Educational L...Show More

Abstract:

This paper presents a set of low-cost desktop IC test systems developed for engineering education. The set is implemented using the National Instrument (NI) Educational Laboratory Virtual Instrumentation Suite (ELVIS) and custom-made load boards. The software is based on the NI LabVIEW development environment. The set has been developed and employed for teaching electronic testing, instrumentation and measurement, and advanced electronic circuits courses within several undergraduate and graduate engineering programs at three universities in Malaysia, Vietnam, and New Zealand.
Date of Conference: 26-28 June 2017
Date Added to IEEE Xplore: 31 July 2017
ISBN Information:
Electronic ISSN: 2377-9322
Conference Location: Annecy, France

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