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A comparison among tools for the diagnosability of discrete event systems | IEEE Conference Publication | IEEE Xplore

A comparison among tools for the diagnosability of discrete event systems


Abstract:

In this paper we compare three tools for the diagnosability analysis of discrete event systems. After introducing the notion of diagnosability, we recall for each tool th...Show More

Abstract:

In this paper we compare three tools for the diagnosability analysis of discrete event systems. After introducing the notion of diagnosability, we recall for each tool the main theoretical results on which it is based. A benchmark that describes a parametric manufacturing system is defined and used for comparison. We report the numerical results obtained for different values of the parameters and draw some general conclusions on the advantages and possible improvements of these tools.
Date of Conference: 20-24 August 2012
Date Added to IEEE Xplore: 20 December 2012
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Conference Location: Seoul, Korea (South)

References

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