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Generating Adversarial Samples via a Combination of Feature Selection and Optimized Perturbation Methods | IEEE Conference Publication | IEEE Xplore

Generating Adversarial Samples via a Combination of Feature Selection and Optimized Perturbation Methods


Abstract:

Deep learning has been widely used in cyber security disciplines. Deep learning-based intrusion detection systems currently play an important role in network security pro...Show More

Abstract:

Deep learning has been widely used in cyber security disciplines. Deep learning-based intrusion detection systems currently play an important role in network security protection. However, these intrusion detection systems may be misclassified when an attacker introduces expert-designed, unrecognizable perturbations to the input samples for attack purposes. Adversarial machine learning has received much attention in the field of image recognition.However, there hasn’t been a lot of research done on intrusion detection. In this paper, we propose a novel attack method for generating adversarial samples. The attack method aims at spoofing intrusion detection systems with minimal modifications.
Date of Conference: 08-10 May 2024
Date Added to IEEE Xplore: 10 July 2024
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Conference Location: Tianjin, China

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