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A digital test for first-order /spl Sigma//spl Delta/ modulators | IEEE Conference Publication | IEEE Xplore

A digital test for first-order /spl Sigma//spl Delta/ modulators


Abstract:

This paper presents a digital structural test for first-order Sigma-Delta modulators. A periodic digital sequence is used as a stimulus to obtain a signature of the integ...Show More

Abstract:

This paper presents a digital structural test for first-order Sigma-Delta modulators. A periodic digital sequence is used as a stimulus to obtain a signature of the integrator leakage. This parameter is known to be related to the modulator precision and its estimation is of great importance to assess if the modulator works as expected. As the proposed technique is fully digital, it is especially suitable to test modulators embedded in complex mixed-signal circuits.
Date of Conference: 16-20 February 2004
Date Added to IEEE Xplore: 08 March 2004
Print ISBN:0-7695-2085-5
Print ISSN: 1530-1591
Conference Location: Paris, France

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