Abstract:
The proposed deterministic model aims to improve Soft Error Rate estimation by accurately approximating the generated pulse and all subsequent pulses. The generated pulse...Show MoreMetadata
Abstract:
The proposed deterministic model aims to improve Soft Error Rate estimation by accurately approximating the generated pulse and all subsequent pulses. The generated pulse is approximated by a piecewise function consisting of two Weibull cumulative distribution functions. This method is an improvement over existing methods as it offers high accuracy while requiring less pre-characterization. This is accomplished by fitting a pulse to the Weibull function using actual gate parameters.
Published in: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Date of Conference: 03-05 October 2012
Date Added to IEEE Xplore: 13 December 2012
ISBN Information: