An effective solution of benchmarking problem: FSM benchmark generator and its application to analysis of state assignment methods | IEEE Conference Publication | IEEE Xplore

An effective solution of benchmarking problem: FSM benchmark generator and its application to analysis of state assignment methods


Abstract:

This paper focuses on the benchmarking that is one of the main issues of the synthesis method and tool development, analysis, characterization and evaluation. To solve se...Show More

Abstract:

This paper focuses on the benchmarking that is one of the main issues of the synthesis method and tool development, analysis, characterization and evaluation. To solve several serious problems related to the usage of practical industrial benchmarks, we developed and implemented an FSM benchmark generator (BenGen). BenGen makes us possible to efficiently construct FSMs with various known characteristics, including FSMs representative to various typical industrial application areas, greatly reduces the necessity of having the actual industrial benchmarks, and enables research, comparison, evaluation and fine tuning of circuit synthesis methods largely independent of the industry, and much more effectively and efficiently than having only some industrial benchmarks. Using a large set of benchmarks generated with BenGen, we performed an experiment aiming at the effectiveness characterization of some popular academic and industrial FSM state assignment approaches. The experimental results enabled us among others to demonstrate that the pragmatic assignment approaches used commonly in today's commercial tools are only effective for some special classes of circuits or not effective at all.
Date of Conference: 31 August 2004 - 03 September 2004
Date Added to IEEE Xplore: 20 September 2004
Print ISBN:0-7695-2203-3
Conference Location: Rennes, France

References

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