Surface Defects Detection by Clustering and Rotating Image Analysis | IEEE Conference Publication | IEEE Xplore

Surface Defects Detection by Clustering and Rotating Image Analysis


Abstract:

In this paper the K-means algorithm was used to obtain coordinates of defects by clustering distributed cumulative histogram image. Mean intensity functions of rotating s...Show More

Abstract:

In this paper the K-means algorithm was used to obtain coordinates of defects by clustering distributed cumulative histogram image. Mean intensity functions of rotating sample and its distributed cumulative histogram image were used to determine coordinates of scratches on the surface image.
Date of Conference: 21-25 August 2020
Date Added to IEEE Xplore: 23 September 2020
ISBN Information:
Conference Location: Lviv, Ukraine

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