Abstract:
In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reli...Show MoreMetadata
Abstract:
In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and IDDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.
Published in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Date of Conference: 21-23 April 2015
Date Added to IEEE Xplore: 18 June 2015
Electronic ISBN:978-1-4799-1999-4