Abstract:
Input vector monitoring concurrent Built-In Self-Test (BIST) schemes perform testing during the normal operation of the circuit without imposing a need to set the circuit...Show MoreMetadata
Abstract:
Input vector monitoring concurrent Built-In Self-Test (BIST) schemes perform testing during the normal operation of the circuit without imposing a need to set the circuit off-line in order to perform the test. In this work we present an input vector monitoring concurrent BIST scheme, specially designed for the testing of ROM modules.
Published in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Date of Conference: 21-23 April 2015
Date Added to IEEE Xplore: 18 June 2015
Electronic ISBN:978-1-4799-1999-4
Contents 