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Improved Noise Wave Model of Microwave FETs based on Artificial Neural Networks | IEEE Conference Publication | IEEE Xplore

Improved Noise Wave Model of Microwave FETs based on Artificial Neural Networks


Abstract:

An application of artificial neural networks for accuracy improving of the microwave FET transistor noise modeling is presented in this paper. The proposed model is based...Show More

Abstract:

An application of artificial neural networks for accuracy improving of the microwave FET transistor noise modeling is presented in this paper. The proposed model is based on a basic transistor noise wave model whose noise wave temperatures are assumed to be constant over the operating frequency range. An artificial neural network is included in the model in order to make values of the noise parameters obtained by the original wave model more accurate.
Date of Conference: 27-30 August 2007
Date Added to IEEE Xplore: 23 May 2008
ISBN Information:
Conference Location: Seville, Spain

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