Abstract:
This paper deals with the susceptibility to radio frequency interference of smart power integrated circuits. A method to perform simulations aimed at evaluating the perfo...Show MoreMetadata
Abstract:
This paper deals with the susceptibility to radio frequency interference of smart power integrated circuits. A method to perform simulations aimed at evaluating the performance of subcircuits included in a more complex IC in the presence of EMI is presented. Referring to this, the behaviour of a current sensor included into a high-side power switch during DPI test is investigated. The results of simulation analyses and DPI tests are presented.
Published in: 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
Date of Conference: 10-13 November 2015
Date Added to IEEE Xplore: 17 December 2015
ISBN Information: