Abstract:
On-chip multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorpor...Show MoreMetadata
Abstract:
On-chip multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sample time generation with a 10-bit variable step delay generator and digitization with a 10-bit incremental reference voltage generator. The prototype in a 0.18-/spl mu/m CMOS technology demonstrated on-chip waveform acquisition at 40-ps and 200-/spl mu/V resolutions. The waveforms were as accurate as those acquired by an off-chip measurement technique, while 95% reduction of measurement time was achieved.
Date of Conference: 12-16 September 2005
Date Added to IEEE Xplore: 05 December 2005
Print ISBN:0-7803-9205-1
Print ISSN: 1930-8833