Loading [MathJax]/jax/input/TeX/config.js
Set/reset statistics and kinetics in phase change memory arrays | IEEE Conference Publication | IEEE Xplore

Set/reset statistics and kinetics in phase change memory arrays


Abstract:

The development of next-generation PCM arrays requires a better understanding of set/reset processes at statistical level. This work presents experimental programming cha...Show More

Abstract:

The development of next-generation PCM arrays requires a better understanding of set/reset processes at statistical level. This work presents experimental programming characteristics on 45 nm arrays and analyzes the statistical distribution of set/reset program and read currents. Results show (i) a reset-voltage dependence for both the melt current and the crystallization kinetics and (ii) a reduced crystallization spread in the high-temperature (set) regime, compared to the low-temperature (retention) one.
Date of Conference: 22-26 September 2014
Date Added to IEEE Xplore: 06 November 2014
ISBN Information:

ISSN Information:

Conference Location: Venice Lido, Italy

References

References is not available for this document.