Abstract:
A deterministic compact model of instability is presented, capable of simulating reversible parametric drift under any periodic stress waveform and suitable for the imple...Show MoreMetadata
Abstract:
A deterministic compact model of instability is presented, capable of simulating reversible parametric drift under any periodic stress waveform and suitable for the implementation in a commercial simulator (Eldo UDRM). The methodology has been applied to NBTI-induced threshold voltage drift; an example is shown, in which recovery simulation is crucial for circuit design.
Date of Conference: 22-26 September 2014
Date Added to IEEE Xplore: 06 November 2014
ISBN Information: