Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant | IEEE Conference Publication | IEEE Xplore

Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant


Abstract:

We report a device physics theory and compact model that predicts the threshold voltage mismatch for CMOS transistors using the halo implant. This model is able to fit CM...Show More

Abstract:

We report a device physics theory and compact model that predicts the threshold voltage mismatch for CMOS transistors using the halo implant. This model is able to fit CMOS VT mismatch across temperature and device geometry, validating the underlying physical argument. A bias method is presented and shown to recover part of the matching degradation due to the halo implant.
Date of Conference: 22-26 September 2014
Date Added to IEEE Xplore: 06 November 2014
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Conference Location: Venice Lido, Italy

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