New test compression scheme based on low power BIST | IEEE Conference Publication | IEEE Xplore

New test compression scheme based on low power BIST


Abstract:

This paper describes a new programmable low power test compression method that allows shaping the test power envelope in a fully predictable, accurate, and flexible fashi...Show More

Abstract:

This paper describes a new programmable low power test compression method that allows shaping the test power envelope in a fully predictable, accurate, and flexible fashion by adapting the existing logic BIST infrastructure. The proposed hybrid scheme efficiently combines test compression with logic BIST, where both techniques can work synergistically to deliver high quality test. Experimental results obtained for industrial designs illustrate feasibility of the proposed test scheme and are reported herein.
Date of Conference: 27-30 May 2013
Date Added to IEEE Xplore: 29 July 2013
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Conference Location: Avignon, France

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