Abstract:
In response to reliability challenges of new systems being built, we are proposing a scalable Self-Test architecture for many-core processor systems. This BIST architectu...Show MoreMetadata
Abstract:
In response to reliability challenges of new systems being built, we are proposing a scalable Self-Test architecture for many-core processor systems. This BIST architecture periodically distributes test stimuli among identical processing cores in a many-core processor system, suspends normal operation of individual processing cores, applies test, detects faulty cores, and removes them from the system if any are found faulty. Test is continuously performed without any perceptible down-time to the end-user, realizing a many-core processor system with self-healing capability.
Published in: 2014 19th IEEE European Test Symposium (ETS)
Date of Conference: 26-30 May 2014
Date Added to IEEE Xplore: 08 July 2014
Electronic ISBN:978-1-4799-3415-7