Loading [a11y]/accessibility-menu.js
TDMS Test Scheduler: An Integrated Framework for Test Scheduling of DVFS-based SoCs with Multiple Voltage Islands | IEEE Conference Publication | IEEE Xplore

TDMS Test Scheduler: An Integrated Framework for Test Scheduling of DVFS-based SoCs with Multiple Voltage Islands


Abstract:

TDMS Test Scheduler is a novel and user-friendly toolkit for engineers, researchers and instructors that are activated in the field of manufacturing test. It is the first...Show More

Abstract:

TDMS Test Scheduler is a novel and user-friendly toolkit for engineers, researchers and instructors that are activated in the field of manufacturing test. It is the first toolkit that supports test scheduling based on Time Division Multiplexing (TDM) for multi-core, multi-Vdd Systems-on-Chip (SoCs), as far as the author knows. It is able to provide with solutions that minimize test cost, while power and thermal constraints are met. It offers a) a high-level language to facilitate the representation of a test process, b) two efficient solvers exploiting TDM, c) a rich visualization environment, d) a testbed for educational and research activities. It is free to use.
Date of Conference: 24-28 May 2021
Date Added to IEEE Xplore: 29 June 2021
ISBN Information:

ISSN Information:

Conference Location: Bruges, Belgium

Contact IEEE to Subscribe

References

References is not available for this document.