Abstract:
In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware ...Show MoreMetadata
Abstract:
In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware testing. Subsequently, we introduce an application model that predicts the function coverage using only the I/O workload of the TCs from the above method.
Published in: 2022 IEEE European Test Symposium (ETS)
Date of Conference: 23-27 May 2022
Date Added to IEEE Xplore: 01 July 2022
ISBN Information: