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A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage | IEEE Conference Publication | IEEE Xplore

A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage


Abstract:

In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware ...Show More

Abstract:

In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware testing. Subsequently, we introduce an application model that predicts the function coverage using only the I/O workload of the TCs from the above method.
Date of Conference: 23-27 May 2022
Date Added to IEEE Xplore: 01 July 2022
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Conference Location: Barcelona, Spain

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