An efficient scan tree design for test time reduction | IEEE Conference Publication | IEEE Xplore

An efficient scan tree design for test time reduction

Metadata

First Page of the Article

Published in: Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.

Date of Conference: 26-26 May 2004

Date Added to IEEE Xplore: 25 October 2004

Print ISBN:0-7695-2119-3

DOI: 10.1109/ETSYM.2004.1347657

Conference Location: Corsica, France

First Page of the Article

References is not available for this document.