Diagnosis of failing scan cells through orthogonal response compaction | IEEE Conference Publication | IEEE Xplore

Diagnosis of failing scan cells through orthogonal response compaction


Abstract:

This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression. The sche...Show More

Abstract:

This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression. The scheme is based on a very simple test response compactor employing orthogonal - spatial and time - signatures. The advantage of this scheme as compared to previous work in this field is the simple and incremental nature of the compaction hardware required. The ability of the scheme to accurately identify failing scan cells from compacted responses has been measured on production fail data from five industrial designs and is reported herein.
Date of Conference: 24-28 May 2010
Date Added to IEEE Xplore: 19 July 2010
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Conference Location: Prague, Czech Republic

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