Abstract:
Three different techniques for simulating realistic faults generated from IC layout are discussed. Two of them deal with bridging faults, and the third one handles crosst...Show MoreMetadata
Abstract:
Three different techniques for simulating realistic faults generated from IC layout are discussed. Two of them deal with bridging faults, and the third one handles crosstalk faults. The simulation is performed on top of a commercial simulator and thus is very well applicable in an industrial environment. No change of the design database and only minimal changes of the test shell are required. Experimental results are reported for a library cell and a block from a full-custom design.
Published in: Proceedings The Seventh IEEE European Test Workshop
Date of Conference: 26-29 May 2002
Date Added to IEEE Xplore: 07 November 2002
Print ISBN:0-7695-1715-3
Print ISSN: 1530-1877