Abstract:
This paper shows that in a (n×n) reversible circuit implemented with k-CNOT gates, addition of only two extra input lines along with insertion of few k-CNOT gates can yie...Show MoreMetadata
Abstract:
This paper shows that in a (n×n) reversible circuit implemented with k-CNOT gates, addition of only two extra input lines along with insertion of few k-CNOT gates can yield an easily testable design, which admits a universal test set of size (n+1) to detect all SMGFs, PMGFs, and detectable RGFs in the circuit.
Published in: East-West Design & Test Symposium (EWDTS 2013)
Date of Conference: 27-30 September 2013
Date Added to IEEE Xplore: 25 November 2013
ISBN Information: