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Experimental study on Hamming and Hsiao codes in the context of embedded applications | IEEE Conference Publication | IEEE Xplore

Experimental study on Hamming and Hsiao codes in the context of embedded applications


Abstract:

Increasing soft error rate and decreasing technological nodes sizes pave a way for Error Correcting Codes (ECC) widespread use in embedded systems. Depending on applicati...Show More

Abstract:

Increasing soft error rate and decreasing technological nodes sizes pave a way for Error Correcting Codes (ECC) widespread use in embedded systems. Depending on application safety goals and acceptable performance and area overhead, different codes can be selected. The goal of this paper is to investigate the efficiency and expediency of two of the most prominent ECC codes, Hamming and Hsiao, in the context of embedded memories and provide practical guidance for their exploitation.
Date of Conference: 29 September 2017 - 02 October 2017
Date Added to IEEE Xplore: 16 November 2017
ISBN Information:
Electronic ISSN: 2472-761X
Conference Location: Novi Sad, Serbia

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