Abstract:
A new method has been developed to obtain precise spice models of transistors that can be used in any type of research and training projects. The transistor's input and o...Show MoreMetadata
Abstract:
A new method has been developed to obtain precise spice models of transistors that can be used in any type of research and training projects. The transistor's input and output characteristics have been received that have been compared with the characteristics of the foundry models. Also, Monte Carlo SPICE models were developed for all types of transistors, that are used during AOCV and POCV model's development processes.
Published in: 2019 IEEE East-West Design & Test Symposium (EWDTS)
Date of Conference: 13-16 September 2019
Date Added to IEEE Xplore: 30 October 2019
ISBN Information: