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Development of Method for Automation of SPICE Models Generation | IEEE Conference Publication | IEEE Xplore

Development of Method for Automation of SPICE Models Generation


Abstract:

A new method has been developed to obtain precise spice models of transistors that can be used in any type of research and training projects. The transistor's input and o...Show More

Abstract:

A new method has been developed to obtain precise spice models of transistors that can be used in any type of research and training projects. The transistor's input and output characteristics have been received that have been compared with the characteristics of the foundry models. Also, Monte Carlo SPICE models were developed for all types of transistors, that are used during AOCV and POCV model's development processes.
Date of Conference: 13-16 September 2019
Date Added to IEEE Xplore: 30 October 2019
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Conference Location: Batumi, Georgia

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