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Evaluating the impact of using multiple-metal layers on the layout area of switch blocks for tile-based FPGAs in FinFET 7nm | IEEE Conference Publication | IEEE Xplore

Evaluating the impact of using multiple-metal layers on the layout area of switch blocks for tile-based FPGAs in FinFET 7nm


Abstract:

A new area model for estimating the layout area of switch blocks is introduced in this work. The model not only takes into consideration the active area that is needed to...Show More

Abstract:

A new area model for estimating the layout area of switch blocks is introduced in this work. The model not only takes into consideration the active area that is needed to construct a switch block but also the number of metal layers available and the actual dimension of these metals. The model assigns metal layers to the routing tracks in a way that reduces the number of vias that are needed to connect different routing tracks together while maintaining the tile-based structure of FPGAs. The model is evaluated based on the layouts constructed in ASAP7 FinFET 7nm Predictive Design Kit. We found that the new model improves upon the traditional active-based area estimation models by considering the growth of metal area independently from the growth of the active area. As a result, the new model is able to more accurately estimate layout area by predicting when metal area will overtake active area as the number of routing tracks is increased. This ability allows the more accurate estimation of the true layout cost of FPGA fabrics at the early floor planning and architectural exploration stage; and this increase in accuracy can encourage a wider use of custom FPGA fabrics that target specific sets of benchmarks in future SOC designs.
Date of Conference: 15-18 May 2022
Date Added to IEEE Xplore: 03 June 2022
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Conference Location: New York City, NY, USA

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