Abstract:
Functional coverage models which measure the sufficiency of test stimuli are essential to the verification process. A key source of difficulty in their deployment emanate...Show MoreMetadata
Abstract:
Functional coverage models which measure the sufficiency of test stimuli are essential to the verification process. A key source of difficulty in their deployment emanates from the manual and imprecise nature of their development process and the lack of a sound measure of their quality. A functional coverage model can be considered complete only if it accurately reflects the behavior of the Design under Verification (DUV) as described in the specification. We present a method to automatically generate coverage models from a formal CTL description of design properties. Experimental results show that the functional coverage models generated using our technique correlate well with the detection of randomly injected errors into a design.
Date of Conference: 07-09 November 2007
Date Added to IEEE Xplore: 10 December 2007
Print ISBN:978-1-4244-1480-2
Print ISSN: 1552-6674