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Design and development of an accelerated testing architecture for embedded systems fault monitoring | IEEE Conference Publication | IEEE Xplore
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Design and development of an accelerated testing architecture for embedded systems fault monitoring

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Valeria L. Scarano; Marcantonio Catelani; Andrea Carignano; Daniele Mazzei; Giacomo Baldi
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Abstract:

The evaluation of reliability performances of a commercial embedded module was proposed. Testing procedure, hardware and software architecture for on-line fault monitorin...Show More

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Abstract:

The evaluation of reliability performances of a commercial embedded module was proposed. Testing procedure, hardware and software architecture for on-line fault monitoring was implemented. By means of the application of accelerated climatic testing, the final challenge is to implement a model able to statistically prove the quality and reliability of the module.
Published in: 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Date of Conference: 06-09 May 2013
Date Added to IEEE Xplore: 15 July 2013
ISBN Information:
Print ISSN: 1091-5281
DOI: 10.1109/I2MTC.2013.6555682
Conference Location: Minneapolis, MN, USA
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