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Development of mechanical measurement system applied for electroplastic effect research | IEEE Conference Publication | IEEE Xplore

Development of mechanical measurement system applied for electroplastic effect research


Abstract:

Electrically-assisted manufacturing (EAM) is an emerging metal-manufacturing process which is promising in the automotive and aerospace industries. The process is based o...Show More

Abstract:

Electrically-assisted manufacturing (EAM) is an emerging metal-manufacturing process which is promising in the automotive and aerospace industries. The process is based on the electroplastic effect that is supposed to reduce the stress needed in the forming and improve the ductility of the metal. In this paper, we develop an electroplastic measurement system to study the electroplastic effect of the A5083 aluminum alloy. And the effects of current density and the pulse width on the electroplasticity are preliminary investigated.
Date of Conference: 12-15 May 2014
Date Added to IEEE Xplore: 21 July 2014
Electronic ISBN:978-1-4673-6386-0
Print ISSN: 1091-5281
Conference Location: Montevideo, Uruguay

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