Abstract:
The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the I...Show MoreMetadata
Abstract:
The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the IEEE Std. 1241. Such method can be easily applied to several AIC architectures, based on random sampling or random demodulation. The proposed method has been validated by simulations and by means of a random sampling AIC architecture. Results of both validation phases are reported and discussed in the paper.
Published in: 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings
Date of Conference: 11-14 May 2015
Date Added to IEEE Xplore: 09 July 2015
Electronic ISBN:978-1-4799-6114-6
Print ISSN: 1091-5281
Contents 