Impact of transistor model uncertainty on microwave load-pull simulations | IEEE Conference Publication | IEEE Xplore
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Impact of transistor model uncertainty on microwave load-pull simulations

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Gianni Bosi; Antonio Raffo; Giorgio Vannini; Gustavo Avolio; Dominique Schreurs
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Abstract:

We propagate the uncertainty of measurements used for the identification of a transistor nonlinear model to microwave load-pull simulations. The results are presented for...Show More

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Abstract:

We propagate the uncertainty of measurements used for the identification of a transistor nonlinear model to microwave load-pull simulations. The results are presented for a 0.15-μm GaAs pHEMT under class-AB regime at different frequencies of operation.
Published in: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Date of Conference: 22-25 May 2017
Date Added to IEEE Xplore: 07 July 2017
ISBN Information:
DOI: 10.1109/I2MTC.2017.7969653
Conference Location: Turin, Italy
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