A conformance test suite of localized LOM model | IEEE Conference Publication | IEEE Xplore

A conformance test suite of localized LOM model


Abstract:

Since the approval of IEEE LOM draft standard and the advance of network-driven learning technology, a large number of resource database constructors, content developers ...Show More

Abstract:

Since the approval of IEEE LOM draft standard and the advance of network-driven learning technology, a large number of resource database constructors, content developers and learning management system vendors are likely to describe their relevant learning resources using LOM model. To ensure the process of carrying out correct implementation of LOM, there is need for a conformance test suite of LOM model. Some design and implementation issues related to LOM XML binding, parsing of metadata instance as well as carrying out conformance testing procedure are to be discussed. We hope that the initiative could elicit some opinions with respect to conformance testing of learning technology standards.
Date of Conference: 09-11 July 2003
Date Added to IEEE Xplore: 28 July 2003
Print ISBN:0-7695-1967-9
Conference Location: Athens, Greece

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