Toward a one shot multi-projector profilometry system for full field of view object measurement | IEEE Conference Publication | IEEE Xplore

Toward a one shot multi-projector profilometry system for full field of view object measurement


Abstract:

In this paper a one-shot method to determine the shape of an object from overlapping cosine fringes projected from multiple projectors is presented. This overcomes the li...Show More

Abstract:

In this paper a one-shot method to determine the shape of an object from overlapping cosine fringes projected from multiple projectors is presented. This overcomes the limitation with single projector systems that do not allow imaging the entire object with a single shot. The proposed method projects orthogonal fringe patterns from different projectors and uses Fourier domain filtering to isolate the fringes, which are demodulated using an unscented particle filter. Sources of error are discussed and their effects on the resulting parameter estimation are shown, as well as methods to reduce their impact. The proposed method is tested on simulations and real world objects and it is shown to be effective to isolate interfering fringes and determine the shape of an object.
Date of Conference: 04-09 May 2014
Date Added to IEEE Xplore: 14 July 2014
Electronic ISBN:978-1-4799-2893-4

ISSN Information:

Conference Location: Florence, Italy

References

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