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Terahertz Imaging of Binary Reflectance with Variational Bayesian Inference | IEEE Conference Publication | IEEE Xplore
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Terahertz Imaging of Binary Reflectance with Variational Bayesian Inference


Abstract:

In this paper, we propose a Bayesian inference approach to extract the binary reflectance pattern of samples from compressed measurements in the terahertz (THz) frequency...Show More

Abstract:

In this paper, we propose a Bayesian inference approach to extract the binary reflectance pattern of samples from compressed measurements in the terahertz (THz) frequency band. Compared with existing compressed THz imaging methods relying on the sparsity of the reflectance pattern, the proposed Bayesian approach exploits the non-negative binary nature of the reflectance without any assumption on its spatial pattern information and enables a pixel-wise iterative inference approach for fast signal recovery. Numerical evaluation confirms the effectiveness of the proposed approach.
Date of Conference: 15-20 April 2018
Date Added to IEEE Xplore: 13 September 2018
ISBN Information:
Electronic ISSN: 2379-190X
Conference Location: Calgary, AB, Canada

References

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